Atomic force microscopy (AFM) offers a potential solution for analyzing nanoplastics without the need for
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“Other research activities
(19:15 Hanoi time, May 26th, 2023) The last progress report has been held virtually for
The term of Reference (TOR) is formed during the scoping process. Depending on the EIA
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The electron microscope, due to the wave properties of emitted electrons from a thin filament
(11:30, 07/05/2023, GMT+7) After a safe flight, the researcher arrived in Balikpapan City (Indonesia) to